High-Resolution Imaging
High-performance microfocus source and precision detector for sharper imaging
Combine high-resolution imaging, four-axis motion, and intelligent algorithms for more precise and efficient inspection.
High-performance microfocus source and precision detector for sharper imaging
Precision X/Y/Z/R motion for multi-angle inspection of complex structures
AI-assisted judgment to improve inspection efficiency and accuracy
Fully enclosed tube design with multi-interlocks and radiation shielding for safe, reliable operation
Offline programming reduces wait time and improves production efficiency
Internal defect inspection for a wide range of industries and products

Solder joints, cold joints, voids, bridges, and related defects

BGA balls, voids, bridges, and pad defects

Package, lead-frame, bonding, and related internal defects

Connector terminals, welds, pins, and related defects

Internal structure of inductors, capacitors, diodes, and similar components
HF-S80 is Wahfei Technology's four-axis entry offline X-ray inspection system for observing internal structure and solder condition without destroying the workpiece.
It suits offline inspection of electronics, PCBA, BGA, and similar samples — a foundation platform for quality analysis, process validation, and sample review.
Imaging configuration, workpiece size, and inspection range depend on material, thickness, and target defects. Submit sample information for tailored evaluation and selection advice.
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