The Wahfei HF-XT1000 adopts advanced real-time scanning and reconstruction technology,completing 3D reconstruction during the scanning process to greatly improve efficiency.
The system provides fast automatic scanning,data reconstruction,and analysis—ideal for nondestructive inspection of electronic components,capacitors,IC chips,and lithium batteries.
With intelligent defect color rendering,it visually displays defect positions and types for precise analysis.
Combined with the HDR enhancement algorithm,imaging is more balanced and detailed,significantly improving inspection precision and reliability.
Widely applied in industrial quality control,electronics manufacturing,and new energy industries.